Radiation Effects on Nanophotonic Devices and Integrated Circuits for Space Missions

The SCALE program aims to understand the radiation effects on nanophotonic devices and integrated circuits for space missions. The course covers various aspects of photonic integrated circuits (PICs), including their design, fabrication, and testing. It discusses the importance of understanding radiation effects on PICs, which are critical components in many space-based systems. The course also highlights the challenges associated with designing and testing PICs for space applications, such as the need to ensure reliable operation over long periods and in harsh radiation environments.
The main topics covered in the course include the design and fabrication of photonic devices, such as lasers and photodetectors, and their integration into PICs. The course also discusses the effects of radiation on these devices, including single-event effects (SEEs) and total ionizing dose (TID). It reviews various testing methods for evaluating the radiation hardness of PICs, including accelerated testing and simulation techniques. Additionally, the course touches on the importance of considering the entire system, including electronics and control systems, when designing PICs for space missions. Overall, the SCALE program provides a comprehensive understanding of the challenges and opportunities associated with using nanophotonic devices and integrated circuits in space-based systems.